Number of the records: 1
GaN quantum dot polarity determination by X-ray photoelectron diffraction
- 1.Romanyuk, Olexandr - Bartoš, Igor - Brault, J. - De Mierry, P. - Paskova, T. - Jiříček, Petr
GaN quantum dot polarity determination by X-ray photoelectron diffraction.
Applied Surface Science. Roč. 389, Dec (2016), s. 1156-1160. ISSN 0169-4332. E-ISSN 1873-5584
Impact factor: 3.387, year: 2016
http://hdl.handle.net/11104/0262652
Number of the records: 1