Number of the records: 1
GaN quantum dot polarity determination by X-ray photoelectron diffraction
- 1.ROMANYUK, O., BARTOŠ, I., BRAULT, J., DE MIERRY, P., PASKOVA, T., JIŘÍČEK, P. GaN quantum dot polarity determination by X-ray photoelectron diffraction. Applied Surface Science. 2016, 389(Dec), 1156-1160. ISSN 0169-4332. E-ISSN 1873-5584. Available: doi: 10.1016/j.apsusc.2016.07.169
Number of the records: 1