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Study of multi-layered graphene by ultra-low energy SEM/STEM
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SYSNO ASEP 0459573 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Study of multi-layered graphene by ultra-low energy SEM/STEM Author(s) Mikmeková, Eliška (UPT-D) RID
Frank, Luděk (UPT-D) RID, SAI, ORCID
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Li, B. W. (KR)
Ruoff, R. S. (KR)
Lejeune, M. (FR)Number of authors 6 Source Title Diamond and Related Materials. - : Elsevier - ISSN 0925-9635
Roč. 63, March 2016 (2016), s. 136-142Number of pages 7 s. Language eng - English Country CH - Switzerland Keywords scanning ultra low energy electron microscopy ; graphene ; contamination ; CVD Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 UT WOS 000371942700025 EID SCOPUS 84959251388 DOI 10.1016/j.diamond.2015.12.012 Annotation Scanning electron microscopy with very slow electrons offers a novel tool enabling one to image the graphene samples at nanometer or even sub-nanometer lateral resolution in transmitted as well as reflected electrons and to count reliably the atomic layers in both imaging modes. The study was performed on graphene prepared by chemical vapor deposition on thin copper foil. Observation by slow electrons has also confirmed the underlayer mechanism of nucleation and growth bellow already existing graphene layers on copper. Moreover, electrons with impacted energy below 100 eV can be used for "cleaning" of a material. It leads to elimination of the contamination process during the measurement, which enables to observe the predicted oscillations in reflection mode and to measure the transmissivity of various stacks of layers in transmission mode down to units of eV. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2017
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