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Advanced interferometry systems for dimensional measurement in nanometrology

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    SYSNO ASEP0441274
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleAdvanced interferometry systems for dimensional measurement in nanometrology
    Author(s) Lazar, Josef (UPT-D) RID, ORCID, SAI
    Holá, Miroslava (UPT-D) RID, ORCID, SAI
    Hrabina, Jan (UPT-D) RID, ORCID, SAI
    Oulehla, Jindřich (UPT-D) RID, ORCID, SAI
    Číp, Ondřej (UPT-D) RID, SAI, ORCID
    Vychodil, M. (CZ)
    Sedlář, P. (CZ)
    Provazník, M. (CZ)
    Number of authors8
    Source TitleOptics and Measurement Conference 2014 (Proceedings of SPIE 9442). - Bellingham : SPIE, 2014 - ISSN 0277-786X - ISBN 9781628415575
    Pages94420p: 1-6
    Number of pages6 s.
    Publication formOnline - E
    ActionOptics and Measurement Conference 2014 (OaM 2014)
    Event date07.10.2014-10.10.2014
    VEvent locationLiberec
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsinterferometry ; highly-coherent lasers ; signal processing
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsGB14-36681G GA ČR - Czech Science Foundation (CSF)
    TA02010711 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    TA01010995 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    TE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUPT-D - RVO:68081731
    UT WOS000349403500024
    EID SCOPUS84922764371
    DOI10.1117/12.2086613
    AnnotationWe report on the results of the common collaborative project of applied research where the Institute of Scfientific Instruments (ISI) of the Academy of Sciences of the Czech Republic and a company Meopta – optika joined their effort in development of high-precision interferometric systems for dimensional metrology and nanometrology. This research exploits previous results in the field of laser standards of optical frequencies and the methodology of interferometric metrology of length together with detection systems of interference signals and their processing at the ISI and the production technology of precise optical components at Meopta – optika. The main aim of the project is a design of a complex interferometric measuring system in a form of a prototype serving as a master for further production. It concept is a modular family of components configurable for various arrangements primarily for multi-axis measurements in nanotechnology and surface inspection. Within this project we developed a compact, solid-state frequency stabilized laser referenced to iodine transitions and technology of iodine cells for laser frequency stabilization. A fundamental setup of the laser interferometer has been arranged and tested. The company Meopta – optika contributes with development of new technology together with a design of a machine for processing and polishing of high-precision flat-surface optical components.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2016
Number of the records: 1  

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