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On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation
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SYSNO 0396259 Title On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation Author(s) Kužel, R. (CZ)
Čížek, J. (CZ)
Novotný, Michal (FZU-D) RID, ORCID, SAISource Title Metallurgical and Materials Transactions A. 44A, č. 1 (2013), s. 45-57. - : Springer Document Type Článek v odborném periodiku Grant GAP108/11/0958 GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic Institutional support FZU-D - RVO:68378271 Language eng Country US Keywords zinc oxide thin film * X-ray diffraction * Mg0 * fused silica Permanent Link http://hdl.handle.net/11104/0224096
Number of the records: 1