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On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation

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    SYSNO0396259
    TitleOn X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation
    Author(s) Kužel, R. (CZ)
    Čížek, J. (CZ)
    Novotný, Michal (FZU-D) RID, ORCID, SAI
    Source Title Metallurgical and Materials Transactions A. 44A, č. 1 (2013), s. 45-57. - : Springer
    Document TypeČlánek v odborném periodiku
    Grant GAP108/11/0958 GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryUS
    Keywords zinc oxide thin film * X-ray diffraction * Mg0 * fused silica
    Permanent Linkhttp://hdl.handle.net/11104/0224096
     
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