Number of the records: 1  

On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation

  1. 1.
    Kužel, R. - Čížek, J. - Novotný, Michal
    On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation.
    Metallurgical and Materials Transactions A. 44A, č. 1 (2013), s. 45-57. ISSN 1073-5623. E-ISSN 1543-1940
    Impact factor: 1.730, year: 2013
    http://hdl.handle.net/11104/0224096
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.