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On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation
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$a 10.1007/s11661-012-1432-x $2 DOI 100 $a 20130925d m y slo 03 ba 101 0-
$a eng 102 $a US 200 1-
$a On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation 215 $a 13 s. 463 -1
$1 001 cav_un_epca*0257750 $1 011 $a 1073-5623 $e 1543-1940 $1 200 1 $a Metallurgical and Materials Transactions A $v 44A, č. 1 (2013), s. 45-57 $1 210 $c Springer 610 0-
$a zinc oxide thin film 610 0-
$a X-ray diffraction 610 0-
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$3 cav_un_auth*0281153 $a Kužel $b R. $y CZ $4 070 701 -1
$3 cav_un_auth*0038043 $a Čížek $b J. $y CZ $4 070 701 -1
$3 cav_un_auth*0100418 $a Novotný $b Michal $i Vlnové a částicové šíření světla, optické technologie a materiály $j Wave and corpuscular light propagation, optical technologies and materials $p FZU-D $w Fabrication and Analysis of Functional Materials $4 070 $T Fyzikální ústav AV ČR, v. v. i.
Number of the records: 1