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On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation
- 1.KUŽEL, R., ČÍŽEK, J., NOVOTNÝ, M. On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation. Metallurgical and Materials Transactions A. 2013, 44A(1), 45-57. ISSN 1073-5623. E-ISSN 1543-1940. Available: doi: 10.1007/s11661-012-1432-x
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