Number of the records: 1  

Comparison of noise properties of laser sources intended for multidimensional interferometric tools

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    SYSNO ASEP0388105
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleComparison of noise properties of laser sources intended for multidimensional interferometric tools
    Author(s) Hrabina, Jan (UPT-D) RID, ORCID, SAI
    Lazar, Josef (UPT-D) RID, ORCID, SAI
    Číp, Ondřej (UPT-D) RID, SAI, ORCID
    Number of authors3
    Source TitleCPS 2012. 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proceedings of SPIE Vol.8697). - Bellingham : SPIE, 2012 - ISBN 978-0-8194-9481-8
    Pagess. 869716: 1-10
    Number of pages10 s.
    Publication formPrint - P
    ActionCPS 2012. Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics /18./
    Event date03.09.2012-07.09.2012
    VEvent locationOstravice
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryUS - United States
    Keywordsinterferometry ; lasers noise ; nanometrology ; atomic force microscopy
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsGPP102/11/P820 GA ČR - Czech Science Foundation (CSF)
    GA102/09/1276 GA ČR - Czech Science Foundation (CSF)
    KAN311610701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    TA02010711 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    UT WOS000319864100042
    EID SCOPUS84875959095
    DOI10.1117/12.2010115
    AnnotationThis work is oriented towards investigation of displacement measurement uncertainty contribution of different laser sources that are suitable for powering multidimensional interferometric positioning system for local probe microscopy. Main aim of this work was to find a suitable laser source for this measuring system. Most common 633 nm He-Ne lasers were compared with 532 nm frequency-doubled Nd:YAGs of different construction (external cavity doubling, ring configuration laser). We investigated amplitude and frequency noise of several lasers intended for micro- and nano- CMMs (coordinate measurement machines) and compared their noise properties together with the aim to find the best option. Amplitude noise measurements were done directly with the help of low noise photodetector, frequency noise of tested lasers was measured by two approaches – first with the help of Fabry-Perot resonator, which was used as a frequency discriminator converting a frequency (phase) noise into the amplitude one and second directly with the help of interferometer – measuring of interferometric fringe signal and position evaluation – another type of frequency discriminator. Both frequency noise and also amplitude noise measurements were done simultaneously to have a chance to compare both approaches and results.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2013
Number of the records: 1  

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