Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV
1.
SYSNO ASEP
0204995
Document Type
C - Proceedings Paper (int. conf.)
R&D Document Type
Conference Paper
Title
Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV
Author(s)
Zadražil, Martin (UPT-D) El Gomati, M. M. (GB)
Source Title
Proceedings of the 14th International Congress on Electron Microscopy, General Interest and Instrumentation. / Benavides H. A. C. ; Yacamán M. J.. - Bristol : Institute of Physics Publishing Ltd., 1998
- ISBN 0-7503-0568-1
Pages
s. 495-496
Number of pages
2 s.
Action
ICEM /14./ - International Congress on Electron Microscopy
Event date
31.08.1998-04.09.1998
VEvent location
Cancun
Country
MX - Mexico
Language
eng - English
Country
MX - Mexico
Subject RIV
JA - Electronics ; Optoelectronics, Electrical Engineering
Workplace
Institute of Scientific Instruments
Contact
Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing
1999
Number of the records: 1
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