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Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold
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SYSNO 0497873 Title Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold Author(s) Makhotkin, I.A. (NL)
Milov, I. (NL)
Chalupský, Jaromír (FZU-D) RID, ORCID
Tiedtke, K. (DE)
Enkisch, H. (DE)
de Vries, G. (NL)
Scholze, F. (DE)
Siewert, F. (DE)
Sturm, J.M. (NL)
Nikolaev, K. (NL)
van de Kruijs, R.W.E. (NL)
Smithers, M.A. (NL)
van Wolferen, H.A.G.M. (NL)
Keim, E.G. (NL)
Louis, E. (NL)
Jacyna, I. (PL)
Jurek, M. (PL)
Klinger, D. (PL)
Pelka, J. B. (PL)
Juha, Libor (FZU-D) RID, ORCID, SAI
Hájková, Věra (FZU-D) RID, ORCID
Vozda, Vojtěch (FZU-D) ORCID
Burian, Tomáš (FZU-D) RID, ORCID
Saksl, Karel (FZU-D)
Faatz, B. (DE)
Keitel, B. (DE)
Ploenjes, E. (DE)
Schreiber, S. (DE)
Toleikis, S. (DE)
Loch, R. (DE)
Hermann, M. (DE)
Strobel, S. (DE)
Donker, R. (NL)
Mey, T. (DE)
Sobierajski, R. (PL)Source Title Journal of the Optical Society of America. B. Roč. 35, č. 11 (2018), s. 2799-2805. - : Optical Society of America Document Type Článek v odborném periodiku Grant GA17-05167s GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic LG15013 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA14-29772S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic Institutional support FZU-D - RVO:68378271 Language eng Country US Keywords interaction of femtosecond XUV pulses * single-shot ablation threshold * damage accumulation in thin ruthenium films Permanent Link http://hdl.handle.net/11104/0290344
Number of the records: 1