Microscopic characterizations of nanostructured silicon thin films for solar cells

Number of the records: 1

1.

SYSNO	0375054
Title	Microscopic characterizations of nanostructured silicon thin films for solar cells
Author(s)	Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Klapetek, P. (CZ) Zlámal, J. (CZ) Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology. S. 313-321. - Warrendale : MRS, 2011 / Yan B. ; Higashi S. ; Tsai C.C. ; Wang Q. ; Gleskova H.
Conference	Materials Research Society Spring Meeting, San Francisko, 25.04.2011-29.04.2011
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	MEB061012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	no. 240826, XE - EU countries
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Language	eng
Country	US
Keywords	silicon * scanning probe methods * solar cells
Permanent Link	http://hdl.handle.net/11104/0207821

Number of the records: 1