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Performance of detector elements for electron microscopes
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SYSNO ASEP 0205232 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Performance of detector elements for electron microscopes Author(s) Schauer, Petr (UPT-D) RID, SAI, ORCID
Autrata, Rudolf (UPT-D)Source Title Jemná mechanika a optika. - : Fyzikální ústav AV ČR, v. v. i. - ISSN 0447-6441
Roč. 45, č. 10 (2000), s. 268-270Number of pages 3 s. Language eng - English Country CZ - Czech Republic Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GA102/98/0796 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z2065902 - UPT-D Annotation Signal processing in scanning and transmission electron microscopes is analysed in this paper. Distinguished are criteria of principal and commercial significance, and problematic parameters of different systems are highlighted. The most important properties of scintillation detection systems and imaging screens are discussed more in detail. For the scintillation detector, the analysis of conversion of the signal to photons, their transport from emission centres to PMT photocathode, and their conversion to photoelectrons is carried out. For the imaging screen, the attention is focused on the spectral matching and spatial resolution. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2001
Number of the records: 1