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Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation

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    SYSNO ASEP0584210
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleIon emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation
    Author(s) Krása, J. (CZ)
    Nassisi, V. (IT)
    Burian, Tomáš (UFP-V) ORCID
    Hájková, V. (CZ)
    Chalupský, J. (CZ)
    Jelínek, Šimon (UFP-V) ORCID
    Frantálová, K. (CZ)
    Krupka, Michal (UFP-V) ORCID
    Kuglerová, Z. (CZ)
    Singh, Sushil Kumar (UFP-V) ORCID
    Vozda, V. (CZ)
    Vyšín, L. (CZ)
    Wild, J. (CZ)
    Šmíd, M. (DE)
    Perez-Martin, P. (DE)
    Pan, X. (DE)
    Kühlman, M. (DE)
    Pintor, J. (FR)
    Cikhardt, J. (CZ)
    Dreimann, M. (CZ)
    Eckermann, D. (DE)
    Rosenthal, F. (DE)
    Vinko, S. M. (GB)
    Forte, A. (GB)
    Gawne, T. (GB)
    Campbell, T. (GB)
    Ren, S. (GB)
    Shi, Y. F. (GB)
    Hutchinson, T. (US)
    Humphries, O. (DE)
    Preston, T. (DE)
    Makita, M. (DE)
    Nakatsutsumi, M. (DE)
    Köhler, A. (DE)
    Harmand, M. (FR)
    Toleikis, S. (DE)
    Falk, K. (CZ)
    Juha, L. (CZ)
    Number of authors38
    Article number125780J
    Source TitleProceedings of SPIE - The International Society for Optical Engineering, 12578. - Bellingham : SPIE, 2023 - ISSN 0277-786X - ISBN 9781510662766
    Pagesroč. 12578 (2023)
    Number of pages9 s.
    Publication formOnline - E
    ActionConference on Optics Damage and Materials Processing by EUV/X-ray Radiation VIII (XDam8)
    Event date24.04.2023 - 26.04.2023
    VEvent locationPrague
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    KeywordsAblation ; femtosecond pulses ; free-electron laser ; ion acoustic velocity ; ion detector function ; ion diagnostics ; ion rarefaction ; ion scaling ; nanosecond pulses ; soft-x-ray laser ; UV excimer laser
    Subject RIVBL - Plasma and Gas Discharge Physics
    OECD categoryFluids and plasma physics (including surface physics)
    R&D ProjectsLM2023068 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA20-08452S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUFP-V - RVO:61389021
    EID SCOPUS85170825537
    DOI10.1117/12.2670113
    AnnotationWe report on ion emission from plasma produced on thick targets irradiated with nanosecond and femtosecond pulses delivered by mid-ultraviolet and soft x-ray lasers, respectively. To distinguish between different ion acceleration mechanisms, the maximum kinetic energy of ions produced under different interaction conditions is plotted versus laser fluence. The transformation of the time-of-flight detector signal into ion charge density distance-of-flight spectra makes it possible to determine the mean kinetic energy of the fastest ion groups based on the influence of the acoustic velocity of ion expansion. This allows obtaining additional characteristics of the ion production. The final energy of the group of fast ions determined using the ion sound velocity model is an order of magnitude larger in the fs-XFEL interaction than in the ns-UV one. On the contrary, the ablation yield of ions in our experiment is seven orders of magnitude greater when applying ns-UV laser pulses, not only due to higher energies of UV laser pulses, but also due to a significant difference in interaction and ion formation mechanisms.
    WorkplaceInstitute of Plasma Physics
    ContactVladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975
    Year of Publishing2024
    Electronic addresshttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/12578/2670113/Ion-emission-from-plasmas-produced-by-femtosecond-pulses-of-short/10.1117/12.2670113.short
Number of the records: 1  

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