Large-Area Mechanically-Exfoliated Two-Dimensional Materials on Arbitrary Substrates

Sahu, Satyam; Haider, Golam; Rodriguez, Álvaro; Plšek, Jan; Mergl, Martin; Kalbáč, Martin; Frank, Otakar; Velický, Matěj

doi:https://dx.doi.org/10.1002/admt.202201993

Number of the records: 1

Large-Area Mechanically-Exfoliated Two-Dimensional Materials on Arbitrary Substrates

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SYSNO ASEP	0571408
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Large-Area Mechanically-Exfoliated Two-Dimensional Materials on Arbitrary Substrates
Author(s)	Sahu, Satyam (UFCH-W) Haider, Golam (UFCH-W)_{ORCID, RID} Rodriguez, Álvaro (UFCH-W) Plšek, Jan (UFCH-W)_{RID, ORCID} Mergl, Martin (UFCH-W) Kalbáč, Martin (UFCH-W)_{RID, ORCID} Frank, Otakar (UFCH-W)_{RID, ORCID} Velický, Matěj (UFCH-W)_{ORCID, RID, SAI}
Article number	2201993
Source Title	Advanced Materials Technologies - ISSN 2365-709X Roč. 8, č. 12 (2023)
Number of pages	9 s.
Language	eng - English
Country	US - United States
Keywords	2D materials ; arbitrary substrates ; flake transfers ; gold-assisted exfoliation ; heterostructures ; photodetectors
Subject RIV	CF - Physical ; Theoretical Chemistry
OECD category	Physical chemistry
R&D Projects	GX20-08633X GA ČR - Czech Science Foundation (CSF)
	EF16_026/0008382 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Method of publishing	Open access
Institutional support	UFCH-W - RVO:61388955
UT WOS	000976089600001
EID SCOPUS	85153393243
DOI	10.1002/admt.202201993
Annotation	Atomically-thin crystals have been shown to be rich in fundamental phenomena and are promising for various applications. Mechanical exfoliation of (2D) materials from bulk crystals is particularly suited for fundamental studies due to the high quality of the resulting monolayer crystals. To date, several techniques have been developed to increase the exfoliation yield, however, they still suffer drawbacks. In this work, a novel method that exploits gold-assisted exfoliation to prepare large-area monolayers of various layered materials followed by their transfer to arbitrary substrates is introduced. X-ray photoelectron, Raman, and photoluminescence spectroscopies are employed to assess the quality of the prepared layers and their optical properties. Then, field-effect transistors and photodetectors are fabricated to demonstrate the suitability of this technique for large-area optoelectronic devices.
Workplace	J. Heyrovsky Institute of Physical Chemistry
Contact	Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196
Year of Publishing	2024
Electronic address	https://hdl.handle.net/11104/0342637

Number of the records: 1