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Nucleation of diamond micro-patterns with photoluminescent SiV centers controlled by amorphous silicon thin films
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SYSNO ASEP 0520201 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Nucleation of diamond micro-patterns with photoluminescent SiV centers controlled by amorphous silicon thin films Author(s) Fait, Jan (FZU-D) ORCID
Potocký, Štěpán (FZU-D) RID, ORCID
Stehlík, Štěpán (FZU-D) RID, ORCID
Stuchlík, Jiří (FZU-D) RID, ORCID
Artemenko, Anna (FZU-D) RID, ORCID
Kromka, Alexander (FZU-D) RID, ORCID, SAI
Rezek, B. (CZ)Number of authors 7 Source Title Applied Surface Science. - : Elsevier - ISSN 0169-4332
Roč. 480, June (2019), s. 1008-1013Number of pages 6 s. Language eng - English Country NL - Netherlands Keywords spontaneous nucleation ; diamond ; hydrogenated amorphous silicon ; selective growth ; focused microwave CVD Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects EF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA17-19968S GA ČR - Czech Science Foundation (CSF) Method of publishing Limited access Institutional support FZU-D - RVO:68378271 UT WOS 000463008200115 EID SCOPUS 85062731816 DOI 10.1016/j.apsusc.2019.03.064 Annotation Selective deposition of diamond allows bottom-up growth of diamond nanostructures and nanoscale devices. However, it remains challenging to reduce the size of the patterns and to suppress parasitic spontaneous nucleation. We show here that thin layers of hydrogenated amorphous silicon (down to 40 nm) efficiently suppress spontaneous nucleation of diamond. The suppression of diamond nucleation does not depend on the substrate materials below hydrogenated amorphous silicon (Si, SiO2, Pt, Ni). We attribute the suppressed diamond nucleation to surface disorder on atomic scale. By using a structured layer of hydrogenated amorphous silicon, highly selective growth of diamond micro-patterns with optically active SiV centers by low-temperature microwave plasma chemical vapor deposition is achieved. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2020 Electronic address https://doi.org/10.1016/j.apsusc.2019.03.064
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