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Profilometry with sub-nanometre precision by Raman spectroscopy
- 1.Ledinský, M., Hájková, Z., Vetushka, A., Tomasi, A., Paviet-Salomon, B., Despeisse, M., Řáhová, J., Frank, O., De Wolf, S., Ballif, C., Fejfar, A. Profilometry with sub-nanometre precision by Raman spectroscopy. In: SHRBENÁ, J., ed. NANOCON 2016. List of Abstracts. Ostrava: Tanger Ltd., 2016, s. 56-56. ISBN 978-80-87294-68-0.
Number of the records: 1