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The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation
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SYSNO 0454066 Title The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation Author(s) Nekvindová, P. (CZ)
Švecová, B. (CZ)
Staněk, S. (CZ)
Vytykačová, S. (CZ)
Macková, Anna (UJF-V) [ONF] RID, ORCID, SAI
Malinský, Petr (UJF-V) [ONF] RID, ORCID, SAI
Machovič, V. (CZ)
Špirková, J. (CZ)Source Title Ceramics - Silikáty. Roč. 59, č. 3 (2015), s. 187-193. - : University of Chemistry and Technology Prague Document Type Článek v odborném periodiku Grant GBP108/12/G108 GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic LM2011019 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UJF-V - RVO:61389005 Language eng Country CZ Keywords glasses * nano particles * Raman spectroscopy * ion implantation Cooperating institutions Vysoká škola chemicko-technologická v Praze (Czech Republic)
Univerzita Jana Evangelisty Purkyně v Ústí nad Labem (Czech Republic)Permanent Link http://hdl.handle.net/11104/0254757
Number of the records: 1