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The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation
- 1.0454066 - ÚJF 2016 CZ eng J - Journal Article
Nekvindová, P. - Švecová, B. - Staněk, S. - Vytykačová, S. - Macková, Anna - Malinský, Petr - Machovič, V. - Špirková, J.
The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation.
Ceramics - Silikáty. Roč. 59, č. 3 (2015), s. 187-193. ISSN 0862-5468. E-ISSN 1804-5847
R&D Projects: GA ČR(CZ) GBP108/12/G108; GA MŠMT LM2011019
Institutional support: RVO:61389005
Keywords : glasses * nano particles * Raman spectroscopy * ion implantation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.485, year: 2015
Permanent Link: http://hdl.handle.net/11104/0254757
Number of the records: 1