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Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam
- 1.Dluhoš, J., Petrenec, M., Peřina, P., Reinauer, F., Kopeček, J., Hrnčíř, T., Jiruše, J. Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam. In: HOZÁK, P., ed. Proceedings of 18th International Microscopy Congress. Prague: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6721-4.
Number of the records: 1