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Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam
- 1.DLUHOŠ, J., PETRENEC, M., PEŘINA, P., REINAUER, F., KOPEČEK, Jaromír, HRNČÍŘ, T., JIRUŠE, J. Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam. In: HOZÁK, P., ed. Proceedings of 18th International Microscopy Congress. Prague: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6721-4.
Number of the records: 1