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Very low energy electron microscopy of graphene flakes
- 1.0395127 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
Very low energy electron microscopy of graphene flakes.
Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : graphene * very low energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.150, year: 2013
Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.
Permanent Link: http://hdl.handle.net/11104/0225233
Number of the records: 1