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Optical gradient of the trapezium-shaped NaNbO.sub.3./sub. thin films studied by spectroscopic ellipsometry
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SYSNO ASEP 0324122 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Optical gradient of the trapezium-shaped NaNbO3 thin films studied by spectroscopic ellipsometry Title Optický gradient trapeciálních tenkých vrstev NaNbO3 zkoumaných pomocí spektroskopické elipsometrie Author(s) Aulika, I. (LT)
Deyneka, Alexander (FZU-D)
Zauls, V. (LT)
Kundzins, K. (LT)Source Title Journal of the Electrochemical Society. - : Electrochemical Society - ISSN 0013-4651
Roč. 155, č. 10 (2008), G209-G213Number of pages 5 s. Language eng - English Country US - United States Keywords thin films ; ellipsometry ; optical gradient Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects KJB100100703 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) GA202/08/1009 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000258976500052 DOI 10.1149/1.2965786 Annotation Ellipsometric studies of the optical gradient of NaNbO3 thin films were performed in the photon energy range of 1.24–4.96 eV. Effective values of the complex refractive index and thickness nonuniformity, roughness, and depth profile of the real part of the refractive index were evaluated. An increase of the refractive index with increasing of the sample thickness was observed and discussed. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2009
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