Number of the records: 1  

Recent progress with x-ray optics based on Si wafers and glass foils

  1. 1.
    SYSNO ASEP0321637
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleRecent progress with x-ray optics based on Si wafers and glass foils
    TitleNovodobý pokrok s rentgenovou optikou založenou na Si deskách a skleněných foliích
    Author(s) Hudec, René (ASU-R) RID, ORCID
    Sik, J. (CZ)
    Lorenz, M. (CZ)
    Pína, L. (CZ)
    Semencová, V. (CZ)
    Míka, M. (CZ)
    Inneman, A. (CZ)
    Skulinová, Michaela (ASU-R)
    Švéda, L. (CZ)
    Source TitleSpace Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray. - Bellingham : International Society for Optical Engineering, 2008 / Turner M.J.L. ; Flanagan K.A. - ISSN 0277-786X - ISBN 978-0-8194-7221-2
    Pagess. 1-12
    Number of pages12 s.
    Publication formwww - www
    ActionSpace Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray
    Event date23.06.2008-23.06.2008
    VEvent locationMarseille
    CountryFR - France
    Event typeEUR
    Languageeng - English
    CountryUS - United States
    KeywordsX-ray optics ; Si wafers ; glass foils
    Subject RIVBN - Astronomy, Celestial Mechanics, Astrophysics
    R&D ProjectsGP202/07/P510 GA ČR - Czech Science Foundation (CSF)
    IAAX01220701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    ME 918 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10030501 - ASU-R (2005-2011)
    UT WOS000259563700034
    AnnotationWe report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement.
    WorkplaceAstronomical Institute
    ContactRadka Svašková, bibl@asu.cas.cz, Tel.: 323 620 326
    Year of Publishing2009
Number of the records: 1  

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