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Recent progress with x-ray optics based on Si wafers and glass foils
- 1.Hudec, R., Sik, J., Lorenz, M., Pína, L., Semencová, V., Míka, M., Inneman, A., Skulinová, M., Švéda, L. Recent progress with x-ray optics based on Si wafers and glass foils. In: TURNER, M.J.L., FLANAGAN, K.A., eds. Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray. Bellingham: International Society for Optical Engineering, 2008, s. 1-12. Proceedings of the SPIE, 7011. ISBN 978-0-8194-7221-2. ISSN 0277-786X.
Number of the records: 1