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Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'
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SYSNO 0581983 Title Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data' Author(s) Govind, K. (DE)
Oliveros, D. (FR)
Dlouhý, Antonín (UFM-A) RID, ORCID
Legros, M. (FR)
Sandfeld, S. (DE)Source Title MACHINE LEARNING-SCIENCE AND TECHNOLOGY. Roč. 5, č. 1 (2024) Article number 015006 Document Type Článek v odborném periodiku Institutional support UFM-A - RVO:68081723 Language eng Country GB Keywords situ * insights * deep learning * synthetic training data * segmentation * data mining * transmission electron microscopy * dislocation * crystal defect URL https://iopscience.iop.org/article/10.1088/2632-2153/ad1a4e Permanent Link https://hdl.handle.net/11104/0350122
Number of the records: 1