Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'

GOVIND, K., OLIVEROS, D., DLOUHÝ, Antonín, LEGROS, M., SANDFELD, S. Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'. MACHINE LEARNING-SCIENCE AND TECHNOLOGY. 2024, 5(1), 015006. E-ISSN 2632-2153. Available: doi: 10.1088/2632-2153/ad1a4e.