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Combining Low Energy Electron Microscopy and Thermal Raman Spectroscopy for Graphene Analysis
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SYSNO ASEP 0568495 Document Type A - Abstract R&D Document Type O - Ostatní Title Combining Low Energy Electron Microscopy and Thermal Raman Spectroscopy for Graphene Analysis Author(s) Průcha, Lukáš (UPT-D) ORCID
Lejeune, M. (FR)
Kizovský, Martin (UPT-D)
Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAISource Title 16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. - Brno : Czechoslovak Microscopy Society, 2022 / Krzyžánek V. ; Hrubanová K. ; Hozák P. ; Müllerová I. ; Šlouf M. - ISBN 978-80-11-02253-2
S. 166-167Number of pages 2 s. Publication form Online - E Action Multinational Congress on Microscopy /16./ Event date 04.09.2022 - 09.09.2022 VEvent location Brno Country CZ - Czech Republic Event type WRD Language eng - English Country CZ - Czech Republic Keywords graphene ; SLEEM ; Raman Spectroscopy Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Electrical and electronic engineering R&D Projects TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 Annotation Graphene as a very promising material for the semiconductor and battery industry has its indisputable advantages. Though it has been discovered almost two decades ago, we still have
some gaps in knowledge regarding its behavior during temperature changes on different surfaces, even though it is critical for its use in practice. Electron microscopy, and specifically Scanning Low Energy Electron Microscopy (SLEEM), is a very useful analyzing tool for graphene but it is not used very often. Its advantages are not only counting the number of graphene layers and low interaction volume but also because low energy electrons can clean the surface from the hydrocarbons adsorbed from the atmosphere which is necessary specifically for studying 2D materials. On the other hand, Raman spectroscopy is one of the most common tools how to analyze this 2D material very quickly and precisely since the main peaks (2D, G, and D) in the spectra can very precisely tell much useful information about graphene, from the number of layers to lattice disorders. These two analyzing methods together create a powerful duo for analyzing graphene that can be hardly replaceable. Our created graphene is thus analyzed not only by Raman microscope but also by confocal microscope and electron microscope. In this study, we focused on graphene behavior under a very wide range of temperatures ranging from -190 to 600 °C measured during one sitting with the Raman microscope. Our CVD-grown graphene was placed onto different sample surfaces to study how the different thermal expansions affect graphene. In the past, some studies focused mainly on the graphene on the SiO2 surfaces with a lesser range of temperatures but here we added to SiO2 also platinum, gold, and copper. From the Raman spectra, we calculated the Raman spectra thermal shift for all the different substrates. We also studied the thermal disintegration of carbon bonds in graphene not only through the rising D peak but also from the change in the changes in the whole spectrum. From the obtained data, we also proposed the possible temperature for each substrate at which the graphene irreversibly changes its form and thus is destroyed.Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2023 Electronic address https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
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