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Linear Energy Transfer (LET) dependence of graphene oxide dosimeter for different ionizing radiations

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    SYSNO ASEP0562823
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleLinear Energy Transfer (LET) dependence of graphene oxide dosimeter for different ionizing radiations
    Author(s) Torrisi, L. (IT)
    Silipigni, L. (IT)
    Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
    Proverbio, E. (IT)
    Torrisi, A. (IT)
    Number of authors5
    Article number111240
    Source TitleVacuum. - : Elsevier - ISSN 0042-207X
    Roč. 203, SEP (2022)
    Number of pages8 s.
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    KeywordsGraphene oxide dosimetry ; Linear energy transfer (LET) ; XPS spectroscopy ; EDX analysis ; Raman spectroscopy
    OECD categoryNuclear physics
    R&D ProjectsEF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA22-10536S GA ČR - Czech Science Foundation (CSF)
    Research InfrastructureCANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i.
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000865610800001
    EID SCOPUS85131736228
    DOI10.1016/j.vacuum.2022.111240
    AnnotationThe graphene oxide (GO) reduction by ionizing radiation is proportional to the absorbed dose due to the energy release which produces ionizations, deexcitations, chemical bonding breaking, radical formation and recombination, oxygen functional groups and water desorption. Thanks to this, GO can be employed as a dosimeter whose dose can be measured using different analysis techniques, such as Raman spectroscopy, X-ray diffraction (XRD) and Energy Dispersive X-ray (EDX) analysis based on the characteristic X-ray emission, X-ray photoelectron spectroscopy (XPS). To evaluate the GO reduction as a function of the Linear Energy Transfer (LET) of the used radiation, measurements have been performed with XPS and EDX to deduce the C/O atomic ratio versus the X-rays, electron and ion beam energy loss. Results indicate that a linear dependence on LET occurs, as will be presented and discussed.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2023
    Electronic addresshttps://doi.org/10.1016/j.vacuum.2022.111240
Number of the records: 1  

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