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Characterization of Microstructure of Crept Samples of Dissimilar Weld\nJoint Using Standard and Advanced Electron Microscopy Techniques
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SYSNO ASEP 0535536 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve SCOPUS Title Characterization of Microstructure of Crept Samples of Dissimilar Weld
Joint Using Standard and Advanced Electron Microscopy TechniquesAuthor(s) Kasl, J. (CZ)
Jandová, D. (CZ)
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Ambrož, Ondřej (UPT-D) ORCID, RID, SAINumber of authors 4 Source Title Defect and Diffusion Forum. - : Scientific.Net - ISSN 1662-9507
Roč. 405, NOV (2020), s. 294-299Number of pages 6 s. Publication form Online - E Language eng - English Country CH - Switzerland Keywords electron microscopy ; microstructure ; creep test ; martensitic steels Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Materials engineering R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Method of publishing Limited access Institutional support UPT-D - RVO:68081731 EID SCOPUS 85097623310 DOI 10.4028/www.scientific.net/DDF.405.294 Annotation Conventional long-term creep test (CCT) to the rupture and so called accelerated creep
test (ACT) of the dissimilar weld joint made of FB2 and F martensitic steels and of the base
materials were carried out at temperatures ranging from 550 °C to 650 °C in the stress range from 70 to 220 MPa. Assessment of microstructure development and changes of hardness was correlated with the creep strength. During creep at temperatures above 575 °C Laves phase precipitated in all parts of the weld joint and especially in the heat affected zones. Coarse Laves phase particles and their clusters with chromium carbides served as nucleation centers for cavities. As the fine grained heat affected zone of F steel was the softest part of the weld joint, many cavities originated and cause failure of samples. The aim of this paper is to compare results and possibilities of the “standard” methods and advanced scanning electron microscopy performed by instrument equipped with a concentric backscatter electron detector (CBS). Filtering of the signal enables improving
and/or diminishing of selected type of contrast caused by various types of particles of secondary phases. The images were used as an input data for image analysis and developments of microstructures during CCT and ACT were compared. Results have shown that specimens afterACT contains significantly lower content of the Laves phase.Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2021 Electronic address https://www.scientific.net/DDF.405.294
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