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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I

  1. 1.
    SYSNO0534293
    TitleHigh-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I
    Author(s) Mikula, Pavol (UJF-V) [ONF] RID, ORCID, SAI
    Šaroun, Jan (UJF-V) [ONF] RID, ORCID, SAI
    Stammers, James H. (UJF-V) [ONF]
    Em, V. (RU)
    Corespondence/seniorMikula, Pavol - Korespondující autor
    Source Title Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. Roč. 14, SUPPL 1 (2020), s. 146-150. - : Pleiades Publishing
    Document TypeČlánek v odborném periodiku
    Grant LM2015048 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2010011 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUJF-V - RVO:61389005
    Languageeng
    CountryUS
    Keywords powder diffraction * focusing * bent crystal analyzer
    URLhttps://doi.org/10.1134/S1027451020070320
    Permanent Linkhttp://hdl.handle.net/11104/0312522
     
Number of the records: 1  

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