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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I

  1. 1.
    SYSNO ASEP0534293
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleHigh-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I
    Author(s) Mikula, Pavol (UJF-V) RID, ORCID, SAI
    Šaroun, Jan (UJF-V) RID, ORCID, SAI
    Stammers, James H. (UJF-V)
    Em, V. (RU)
    Number of authors4
    Source TitleJournal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. - : Pleiades Publishing - ISSN 1027-4510
    Roč. 14, SUPPL 1 (2020), s. 146-150
    Number of pages5 s.
    Publication formPrint - P
    Languageeng - English
    CountryUS - United States
    Keywordspowder diffraction ; focusing ; bent crystal analyzer
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsLM2015048 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2010011 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000578828100030
    EID SCOPUS85092422901
    DOI10.1134/S1027451020070320
    AnnotationThree-axis setup using a bent perfect crystal monochromator and analyzer was tested in the diffraction study of alpha-Fe(211) polycrystalline pins with diameters of 8 and 2 mm. After the optimal conditions were realized at a neutron wavelength of 0.162 nm, a high angular resolution was achieved up to FWHM (Delta d/d) = 4.7 x 10(-3)and 3.5 x 10(-3)for 8 and 2 mm pins, respectively, within the range of curvatures of the analyzer used. However, open beams were used, i.e., without Soller collimators. Such a diffraction setting can be used in powder diffraction studies, namely, in the analysis of small changes in the lattice parameters or small changes in the diffraction profile due to the application of an external load.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2021
    Electronic addresshttps://doi.org/10.1134/S1027451020070320
Number of the records: 1  

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