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Metalorganic vapor phase epitaxy (MOVPE): Growth, materials properties, and applications

  1. 1.
    SYSNO ASEP0522011
    Document TypeM - Monograph Chapter
    R&D Document TypeMonograph Chapter
    TitleQuantum dots
    Author(s) Hulicius, Eduard (FZU-D) RID, ORCID, SAI
    Hospodková, Alice (FZU-D) RID, ORCID, SAI
    Zíková, Markéta (FZU-D) RID
    Number of authors3
    Source TitleMetalorganic vapor phase epitaxy (MOVPE): Growth, materials properties, and applications. - Chichester : John Wiley & Sons Ltd., 2019 / Capper P. ; Irvine S. - ISBN 9781119313014
    Pagess. 175-216
    Number of pages42 s.
    Number of pages584
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    KeywordsMOVPE ; quantum dots ; growth parameters ; self-assembled Starnski-Krastanov
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsLO1603 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    DOI10.1002/9781119313021.ch6
    AnnotationThis chapter focuses on quantum dots (QDs) embedded inside a semiconductor structure. It talks about metalorganic vapor phase epitaxy (MOVPE) QD preparation only. One can distinguish QD types according to growth modes, growth procedures, materials used, and structures with strain‐reducing layers, types of interfaces, and spatial arrangement of QDs (uncoordinated, array, and single/individual QDs). The three main growth technological procedures used for MOVPE preparation of QDs embedded in the structure are self‐assembled Stranski–Krastanov (SK) growth mode, formation of QDs in prepatterned inverted pyramids, and droplet epitaxy. The most widely used procedure is self‐assembling of QDs in SK growth mode. MOVPE growth parameters such as growth temperature, material type of precursors, reactor pressure, precursor flow ratio, total pressure and flow, complex purity of materials, precursors, and reactor setup can strongly influence the structure and device parameters, as well.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2020
Number of the records: 1  

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