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Structure of epitaxial SrIrO.sub.3./sub. perovskite studied by interference between X-ray waves diffracted by the substrate and the thin film

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    SYSNO ASEP0487516
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleStructure of epitaxial SrIrO3 perovskite studied by interference between X-ray waves diffracted by the substrate and the thin film
    Author(s) Horák, L. (CZ)
    Kriegner, D. (CZ)
    Liu, J. (US)
    Frontera, C. (ES)
    Martí, Xavier (FZU-D) RID, ORCID
    Holý, V. (CZ)
    Number of authors6
    Source TitleJournal of Applied Crystallography. - : Wiley - ISSN 0021-8898
    Roč. 50, Apr (2017), s. 385-398
    Number of pages14 s.
    Languageeng - English
    CountryGB - United Kingdom
    Keywordsperovskites ; epitaxial layers ; X-ray diffraction ; interference
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsGB14-37427G GA ČR - Czech Science Foundation (CSF)
    LG13058 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    UT WOS000399010000007
    EID SCOPUS85017110418
    DOI10.1107/S1600576717000541
    AnnotationA high-pressure metastable orthorhombic phase of SrIrO3 perovskite has been epitaxially stabilized on several substrates (DyScO3, GdScO3, NdScO3 and SrTiO3) in the form of thin monocrystalline layers with (110) surface orientation. The unit-cell parameters of the pseudomorphic thin SrIrO3 layers depend on the biaxial strain imposed by the various substrates due to the different lattice mismatches of the particular substrate and the bulk orthorhombic SrIrO3 structure. Using X-ray diffractometry, it is shown that both compressive and tensile strain increase the lattice parameters a and b, while the angle gamma scales with the applied strain, being smaller or larger than 90 degrees for compressive or tensile strain, respectively, resulting in a small monoclinic distortion of the layer unit cell.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2018
Number of the records: 1  

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