What’s next in Scanning Low Energy Electron Microscopy?

Number of the records: 1

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SYSNO	0481148
Title	What’s next in Scanning Low Energy Electron Microscopy?
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Mikmeková, Eliška (UPT-D)_RID Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Source Title	Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. S. 22. - Wien : Technische Universitaet Wien, 2017
Conference	SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons, 18.09.2017 - 22.09.2017, Pula
Document Type	Abstrakt
Grant	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
	606988, XE - EU countries
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	AT
Keywords	SLEEM * primary beam energy * signal electrons
Permanent Link	http://hdl.handle.net/11104/0276751

Number of the records: 1