What’s next in Scanning Low Energy Electron Microscopy?

Number of the records: 1

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SYSNO ASEP	0481148
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	What’s next in Scanning Low Energy Electron Microscopy?
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Mikmeková, Eliška (UPT-D)_RID Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Number of authors	4
Source Title	Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. - Wien : Technische Universitaet Wien, 2017 S. 22
Number of pages	1 s.
Publication form	Print - P
Action	SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons
Event date	18.09.2017 - 22.09.2017
VEvent location	Pula
Country	IT - Italy
Event type	WRD
Language	eng - English
Country	AT - Austria
Keywords	SLEEM ; primary beam energy ; signal electrons
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Nano-materials (production and properties)
R&D Projects	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
Institutional support	UPT-D - RVO:68081731
Annotation	The optimum contrast can be found in the SLEEM for each specimen, when proper primary beam energy and the collection of the signal electrons by the detector align.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2018

Number of the records: 1