Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Number of the records: 1

1.

SYSNO	0465206
Title	Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Nebesářová, Jana (BC-A)_{RID, ORCID} Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Source Title	Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 926-927. - : Cambridge University Press
Document Type	Článek v odborném periodiku
Grant	GA14-20012S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731 ; BC-A - RVO:60077344
Language	eng
Country	US
Keywords	TEM * STEM * EFTEM
Cooperating institutions	Biologické centrum AV ČR (Czech Republic)
Permanent Link	http://hdl.handle.net/11104/0263873

Number of the records: 1