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Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections
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SYSNO ASEP 0465206 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections Author(s) Skoupý, Radim (UPT-D) RID, ORCID, SAI
Nebesářová, Jana (BC-A) RID, ORCID
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAINumber of authors 3 Source Title Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
Roč. 22, S3 (2016), s. 926-927Number of pages 2 s. Publication form Print - P Language eng - English Country US - United States Keywords TEM ; STEM ; EFTEM Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering Subject RIV - cooperation Biology Centre (since 2006) - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GA14-20012S GA ČR - Czech Science Foundation (CSF) LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 ; BC-A - RVO:60077344 DOI 10.1017/S143192761600547X Annotation Low voltage TEM and STEM (transmission and scanning transmission electron microscope) can be regarded as the method of choice for many structural studies of very thin biological samples like ultrathin sections, viruses etc.. Usually, in a conventional TEM (typical acceleration voltage 60 – 300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). Low voltage STEM allows to image unstained samples that usually show sufficient contrast, but in some cases the staining can be useful. An important parameter for imaging is a sensitivity of the sample to degradation by electron beam. There have been not many studies describing quantitatively the mass loss of the resin sections; the most comprehensive work was performed on the dedicated STEM for molecular mass measurements done at 80 keV, or even at higher electron energies done by EFTEM. The author in [6] describes that polymers stained with a heavy metal should therefore damage more rapidly through the secondary electron mechanism and higher cross sections for scattering. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2017
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