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Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections
- 1.Skoupý, Radim - Nebesářová, Jana - Krzyžánek, Vladislav
Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections.
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 926-927. ISSN 1431-9276. E-ISSN 1435-8115
Impact factor: 1.891, year: 2016
http://hdl.handle.net/11104/0263873
Number of the records: 1