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Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections
- 1.SKOUPÝ, R., NEBESÁŘOVÁ, J., KRZYŽÁNEK, V. Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections. Microscopy and Microanalysis. 2016, 22(S3), 926-927. ISSN 1431-9276. E-ISSN 1435-8115. Available: doi: 10.1017/S143192761600547X
Number of the records: 1