Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains

Number of the records: 1

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SYSNO ASEP	0423862
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	The record was not marked in the RIV
Title	Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains
Author(s)	Pokorná, Zuzana (UPT-D)_{RID, ORCID, SAI} Knápek, Alexandr (UPT-D)_{RID, ORCID, SAI}
Number of authors	2
Source Title	Microscopy conference (MC) 2013. Proceedings, 2. - Regensburg : University of Regensburg, 2013
Pages	s. 329-330
Number of pages	2 s.
Publication form	Online - E
Action	Microscopy Conference 2013
Event date	25.08.2013-30. 08.2013
VEvent location	Regensburg
Country	DE - Germany
Event type	WRD
Language	eng - English
Country	DE - Germany
Keywords	SLEEM ; Crystallographic orientation ; polycrystalline metal ; cathode lens
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
Institutional support	UPT-D - RVO:68081731
Annotation	Scanning Low Energy Electron Microscopy (SLEEM) is a Scanning Electron Microscopy technique in which electrons of an arbitrarily low incident energy (103–100 eV) are used. It makes use of the cathode lens principle, allowing to preserve a very good image resolution even at the lowest incident electron energies.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2014

Number of the records: 1