Mapping of the microscopic strain using scanning low energy electron microscopy

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SYSNO ASEP	0353106
Document Type	K - Proceedings Paper (Czech conf.)
R&D Document Type	The record was not marked in the RIV
Title	Mapping of the microscopic strain using scanning low energy electron microscopy
Author(s)	Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Hovorka, Miloš (UPT-D) Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Man, O. (CZ) Pantělejev, L. (CZ) Kouřil, M. (CZ)
Number of authors	7
Source Title	Mikroskopie 2010. - Nové Město na Moravě : Československá mikroskopická společnost, 2010 / Frank L. ; Hozák P. - ISBN N S. 20
Number of pages	1 s.
Action	Mikroskopie 2010
Event date	17.02.2010-18.02.2010
VEvent location	Nové Město na Moravě
Country	CZ - Czech Republic
Event type	EUR
Language	eng - English
Country	CZ - Czech Republic
Keywords	SEM ; SLEEM ; UFG
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Annotation	Detection of a strain in the microscopic scale is very important under multiple circumstances.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2011

Number of the records: 1