Microscopy of nanoparticles and films with nanoparticles

0346198 - ÚFE 2011 CZ eng C - Conference Paper (international conference)
Kacerovský, Pavel - Žďánský, Karel - Procházková, Olga - Vaniš, Jan - Grym, Jan - Vasiliev, A. - Pašajev, E. M.
Microscopy of nanoparticles and films with nanoparticles.
Materials Structure in Chemistry, Biology, Physics and Technology. Praha: CSCA, 2009 - (Černý, R.; Fiala, J.; Hašek, J.), s. 38-39. ISSN 1211-5894.
[Stucture 2009, Colloquium Czech and Slovak Crystallographic Assosiation. Hluboká nad Vltavou (CZ), 22.06.2009-25.06.2009]
R&D Projects: GA ČR GA102/09/1037; GA AV ČR(CZ) KAN401220801
Institutional research plan: CEZ:AV0Z20670512
Keywords : semiconductor devices * nanostructures
Subject RIV: BM - Solid Matter Physics ; Magnetism

To study the electrophoreticaly deposited nanolayers of reverse micelles with Pd nano-particles on n-type InP substrates a wide range of current microscopic methods has been used. What concerns analytical methods the X-ray diffraction and mass spectrometry SIMS were used. The most relevant results about Pd nanoparticles in the layer were obtained by using HRTEM microscopy and SIMS spectrometry. In nanolayers crystallographic arrangement of Pd nanoparticles has not been found.
Permanent Link: http://hdl.handle.net/11104/0187284