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Combination of Scanning Auger and Very-Low-Energy Electron Microscopy
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SYSNO ASEP 0205126 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Combination of Scanning Auger and Very-Low-Energy Electron Microscopy Author(s) El Gomati, M. M. (GB)
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCIDSource Title Proceedings of the International Centennial Symposium on the Electron / Kirkland A. ; Brown P. D.. - Cambridge : The University Press, 1998 - ISBN 1-86125-051-7 Pages s. 326-333 Number of pages 8 s. Action Electron - Centennial Symposium Event date 15.09.1997-17.09.1997 VEvent location Cambridge Country GB - United Kingdom Language eng - English Country GB - United Kingdom Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GA202/95/0280 GA ČR - Czech Science Foundation (CSF) Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2000
Number of the records: 1