Number of the records: 1  

Cryogenic Sample Holder with Electrical Contacts for UHV SEM/SPM

  1. 1.
    SYSNO ASEP0568602
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    TitleCryogenic Sample Holder with Electrical Contacts for UHV SEM/SPM
    Author(s) Krutil, Vojtěch (UPT-D) ORCID, RID, SAI
    Dupák, Libor (UPT-D) RID, ORCID, SAI
    Fořt, Tomáš (UPT-D) RID, ORCID, SAI
    Matějka, Milan (UPT-D) RID, ORCID, SAI
    Srnka, Aleš (UPT-D) RID, ORCID, SAI
    Vlček, Ivan (UPT-D) RID, ORCID, SAI
    Urban, Pavel (UPT-D) RID, ORCID, SAI
    Source Title16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. - Brno : Czechoslovak Microscopy Society, 2022 / Krzyžánek V. ; Hrubanová K. ; Hozák P. ; Müllerová I. ; Šlouf M. - ISBN 978-80-11-02253-2
    S. 142-143
    Number of pages2 s.
    Publication formOnline - E
    ActionMultinational Congress on Microscopy /16./
    Event date04.09.2022 - 09.09.2022
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    R&D ProjectsTE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    AnnotationWe present a cryogenic sample holder with ten spring-loaded electrical contacts specially designed for an ultra-high vacuum scanning electron microscope combined with a scanning probe
    microscope (UHV SEM/SPM) working in the temperature range of 20 K - 300 K. The contacts serve for the electrical connection of a removable transport pallet carrying a sample to the holder. Besides the sample, the transport pallet can be equipped with a low-temperature sensor, a heating element, and ten solid pins. Two quadruples of contacts allow precise four-wire measurement of electrical properties and temperature of the sample and the remaining pair allows two-wire connection of the heating element. The contact function was successfully verified by measuring the transient electrical resistance at the fixed and the spring contact sections within the whole range of the working temperatures. During the test, the transport pallet was repeatedly loaded into the holder. The limit temperature 22 K of the pallet was reached with a cryogenic helium flow cooling system embedded in a test vacuum chamber at the ambient temperature (~ 300 K). To minimize the effect of water ice condensation on the cold contact surfaces at low temperatures, a cooled thermal shield surrounding the sample holder was used as a water vapour trap. In this configuration, the limit temperature of the pallet was decreased down to 20.5 K. A thorough research study of commercially available sample holders indicates that the holders for the intended use are not available on the market.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2023
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.