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Energy Sensitive Imaging of Focused and Scanning Ion Microbeams with µm Spatial and µs Time Resolution
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SYSNO ASEP 0565860 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Energy Sensitive Imaging of Focused and Scanning Ion Microbeams with µm Spatial and µs Time Resolution Author(s) Granja, C. (CZ)
Oancea, C. (CZ)
Macková, Anna (UJF-V) RID, ORCID, SAI
Havránek, Vladimír (UJF-V) RID, SAI, ORCID
Olšanský, Václav (UJF-V) ORCIDNumber of authors 5 Article number 01007 Source Title EPJ Web of Conferences, 261. - Les ulis : EDP sciences, 2022 Number of pages 12 s. Publication form Online - E Action Applied Nuclear Physics Conference (ANPC 2021) Event date 12.09.2021 - 17.09.2021 VEvent location Prague Country CZ - Czech Republic Event type WRD Language eng - English Country FR - France Keywords ion microbeam ; detectors OECD category Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect) Research Infrastructure CANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i. Institutional support UJF-V - RVO:61389005 DOI 10.1051/epjconf/202226101007 Annotation We inspected and imaged the delivery of ion microbeams with spatial, time and energy sensitivity. Quantum imaging registration event- by-event is provided in high spatial and time resolution with the positionsensitive semiconductor pixel detector Timepix. The detector is operated as a miniaturized radiation camera for flexible measurements at room temperature and in vacuum. Imaging information on beam profile, spatial and time distribution, flux, homogeneity, and deposited energy for individual beam particles is provided. Focused and scanning beams can be imaged and evaluated online. Single particles are registered by the detector including spectral (deposited energy) information on their position at the µm and µs level. Delivered beams can be characterized also in terms of composition by resolving background and unwanted components such as electrons and X rays from primary beam particles. Ion groups of different energy including doublets or scattered particles can be identified. The technique is applicable for ions of energy above few hundred keV and beams of low intensity, below 105 particles/cm2/s. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2023 Electronic address https://doi.org/10.1051/epjconf/202226101007
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