Number of the records: 1  

Handbook of Metrology and Applications

  1. 1.
    SYSNO ASEP0565542
    Document TypeM - Monograph Chapter
    R&D Document TypeMonograph Chapter
    TitleModern Approaches to Statistical Estimation of Measurements in the Location Model and Regression
    Author(s) Kalina, Jan (UIVT-O) RID, SAI, ORCID
    Vidnerová, Petra (UIVT-O) RID, SAI, ORCID
    Soukup, Lubomír (UTIA-B) RID, ORCID
    Number of authors3
    Source TitleHandbook of Metrology and Applications. - Singapore : Springer, 2022 / Aswal D. K. ; Yadav S. ; Takatsuji T. ; Rachakonda P. ; Kumar H. - ISBN 978-981-19-1550-5
    Pagess. 1-22
    Number of pages22 s.
    Number of pages980
    Publication formOnline - E
    Languageeng - English
    CountrySG - Singapore
    Keywordsregression ; measurement error ; error propagation ; robustness ; Bayesian estimation
    OECD categoryStatistics and probability
    R&D ProjectsGA22-02067S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUIVT-O - RVO:67985807 ; UTIA-B - RVO:67985556
    DOI10.1007/978-981-19-1550-5_125-1
    AnnotationMetrology as the science about measurement is highly intertwined with statistical point estimation. Evaluating and controling uncertainty of measurements and analyzing them by means of exploratory data analysis (EDA) or predictive data mining requires to exploit advanced tools of statistical estimation. The main focus of the chapter is devoted to nonstandard approaches to the analysis of measurements in two fundamental models, namely, the location model and linear regression. Robust regression methods, which are resistant to the presence of outlying (anomalous) measurements, are discussed here. An illustration of their performance over a real dataset related to thyroid disease and a Monte Carlo simulation reveal here the least weighted squares estimator, which has remained quite neglected so far, outperforms much more renowned robust regression estimators in terms of the variability. Further, Bayesian estimation in the location model is revealed here to have the ability to incorporate previous measurements in a very intuitive way. Finally, the chapter gives a warning that linear regression performed on data contaminated by measurement errors yields biased estimates and requires specific estimation tools for the so-called measurement error model.
    WorkplaceInstitute of Computer Science
    ContactTereza Šírová, sirova@cs.cas.cz, Tel.: 266 053 800
    Year of Publishing2024
    Electronic addresshttps://dx.doi.org/10.1007/978-981-19-1550-5_125-1
Number of the records: 1  

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