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Tunable visible emission in nanostructured thin films and bulk ZnO
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SYSNO ASEP 0557095 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Tunable visible emission in nanostructured thin films and bulk ZnO Author(s) Yatskiv, Roman (URE-Y) RID, ORCID
Grym, Jan (URE-Y)
Kučerová, Šárka (URE-Y)
Tiagulskyi, Stanislav (URE-Y)
Černohorský, Ondřej (URE-Y)
Bašinová, Nikola (URE-Y)
Veselý, J. (CZ)Number of authors 7 Source Title Journal of Sol-Gel Science and Technology. - : Springer - ISSN 0928-0707
Roč. 102, č. 2 (2022), s. 447-453Number of pages 7 s. Publication form Print - P Language eng - English Country US - United States Keywords luminescence ; photoluminescence ; nanoparticles ; Zinc oxide ; Photoluminescence ; Electrical properties ; Annealing Subject RIV BH - Optics, Masers, Lasers OECD category Optics (including laser optics and quantum optics) R&D Projects GA20-24366S GA ČR - Czech Science Foundation (CSF) Method of publishing Limited access Institutional support URE-Y - RVO:67985882 UT WOS 000777066900001 EID SCOPUS 85127555518 DOI 10.1007/s10971-022-05779-z Annotation This paper offers new insights into the physical phenomena in light emission from ZnO. The effect of the annealing atmosphere and temperature on defect-related emission in ZnO thin films prepared by the sol-gel method and nonpolar ZnO bulk substrates is investigated by photoluminescence spectroscopy, transmission electron microscopy, and DC electrical measurements. It is demonstrated that the post-annealing treatment is a powerful tool to modify intrinsic/extrinsic defects in ZnO and that the defect-related emission can be accurately tailored in a wide range from blue to red by changing the postdeposition processing parameters. Accurate tailoring of the deep-level emission wavelength in ZnO is of great importance in optoelectronics, particularly in white-light-emitting diodes, display devices, or biological labeling. Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2023 Electronic address https://doi.org/10.1007/s10971-022-05779-z
Number of the records: 1