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Quantification of stem images in high resolution sem for segmented and pixelated detectors
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SYSNO 0551125 Title Quantification of stem images in high resolution sem for segmented and pixelated detectors Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Paták, Aleš (UPT-D) RID, ORCID, SAI
Zouhar, Martin (UPT-D) ORCID, RID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Fořt, Tomáš (UPT-D) RID, ORCID, SAI
Unčovský, M. (CZ)
Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAICorespondence/senior Konvalina, Ivo - Korespondující autor Source Title Nanomaterials. Roč. 12, č. 1 (2022). - : MDPI Article number 71 Document Type Článek v odborném periodiku Grant TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic StrategieAV21/6, CZ - Czech Republic Institutional support UPT-D - RVO:68081731 Language eng Country CH Keywords STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging Cooperating institutions Thermo Fisher Scientific Inc. (Czech Republic) URL https://www.mdpi.com/2079-4991/12/1/71 Permanent Link http://hdl.handle.net/11104/0326569
Number of the records: 1