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XPS as an advanced method for analysis of organic materials
- 1.Artemenko, A., Štenclová, P., Babčenko, O., Wågberg, T., Segervald, J., Jia, X., Shchukarev, A., Marton, M., Vojs, M., Kromka, A. XPS as an advanced method for analysis of organic materials. In: KOŽÍŠEK, Z., KRÁL, R., ZEMENOVÁ, P., eds. Book of Abstracts of the 30th Joint Seminar of the Development of Materials Science in Research and Education. Praha: Institute of Physics of the Czech Academy of Sciences, 2020, s. 17-17. ISBN 978-80-907237-1-9.
Number of the records: 1